Samuel Groner
Well-known member
Hi
I'm planning to do some serious opamp tests next year and I need a good test jig for that. All tests should be doable with a good signal generator, 100 MHz scope, a DVM and an AP System One. They are based on Jung's writing but include several modifications and additions from my side.
The sockets are laid out for the 2520 footprint, IC's get a board with a pair of local 100 nF decoupling caps.
Test 1
[removed]
For calibration, RV101 is set (with S101 open) to give overall 60 dB gain. Bandwith limiting to 20 kHz is done with the AP System One (or an external filter).
TP101/102 is used to set desired supply voltage. S102 allows trimming of the closed-loop frequency response of two-pole compensated opamps (they might have a bump in the response without a phase lag capacitor).
S101 closed gives voltage noise measurement and S101 open current noise measurement.
Expected precision: better than 5% down to 0.6 nV/sqrt(Hz) and 100 fA/sqrt(Hz).
Test 2
[removed]
Small- and large-signal transient response, slew-rate and THD+N in inverting unity-gain configuration.
Test 3
[removed]
With S301/302/303 open: small- and large-signal transient response, slew-rate and THD+N in noninverting unity-gain configuration.
Short-circuit protection with S303 closed.
With S301/302 closed: small- and large-signal transient response with capacitive loads.
Test 4
[removed]
With S401/402 open: THD+N for general transfer linearity.
With S401/402 closed: THD+N for output linearity (1k8, 600 and 150 ohm load).
Test 5
[removed]
THD+N for input linearity.
Test 6
[removed]
With S601/602 closed: input offset.
With S601 and/or S602 open: input bias and input offset current.
Expected precision: better than 10% down to 50 uV and 50 pA.
Now a few questions:
* Jung gives a precision of 0.1% for R503; this must be a typo, no?
* are the expected measurement precisions realistic?
* is the polarity of C106 right to avoid reverse bias?
* I plan to use DIL-switches; are these robust enough to accomodate the rather hefty currents in the short-circuit and output linearity test?
* would you add a switch to disconnect "In 1" to avoid RF pickup when doing current noise measurements?
* any other drawing/conceptual error or suggestion?
Thanks for your input and help!
Samuel
I'm planning to do some serious opamp tests next year and I need a good test jig for that. All tests should be doable with a good signal generator, 100 MHz scope, a DVM and an AP System One. They are based on Jung's writing but include several modifications and additions from my side.
The sockets are laid out for the 2520 footprint, IC's get a board with a pair of local 100 nF decoupling caps.
Test 1
[removed]
For calibration, RV101 is set (with S101 open) to give overall 60 dB gain. Bandwith limiting to 20 kHz is done with the AP System One (or an external filter).
TP101/102 is used to set desired supply voltage. S102 allows trimming of the closed-loop frequency response of two-pole compensated opamps (they might have a bump in the response without a phase lag capacitor).
S101 closed gives voltage noise measurement and S101 open current noise measurement.
Expected precision: better than 5% down to 0.6 nV/sqrt(Hz) and 100 fA/sqrt(Hz).
Test 2
[removed]
Small- and large-signal transient response, slew-rate and THD+N in inverting unity-gain configuration.
Test 3
[removed]
With S301/302/303 open: small- and large-signal transient response, slew-rate and THD+N in noninverting unity-gain configuration.
Short-circuit protection with S303 closed.
With S301/302 closed: small- and large-signal transient response with capacitive loads.
Test 4
[removed]
With S401/402 open: THD+N for general transfer linearity.
With S401/402 closed: THD+N for output linearity (1k8, 600 and 150 ohm load).
Test 5
[removed]
THD+N for input linearity.
Test 6
[removed]
With S601/602 closed: input offset.
With S601 and/or S602 open: input bias and input offset current.
Expected precision: better than 10% down to 50 uV and 50 pA.
Now a few questions:
* Jung gives a precision of 0.1% for R503; this must be a typo, no?
* are the expected measurement precisions realistic?
* is the polarity of C106 right to avoid reverse bias?
* I plan to use DIL-switches; are these robust enough to accomodate the rather hefty currents in the short-circuit and output linearity test?
* would you add a switch to disconnect "In 1" to avoid RF pickup when doing current noise measurements?
* any other drawing/conceptual error or suggestion?
Thanks for your input and help!
Samuel